Information card for entry 1557421
| Common name |
Et4N[Pt(tpy)Cl2] |
| Formula |
C17 H26 Cl2 N2 Pt S |
| Calculated formula |
C16.8 Cl2 N2 Pt S1.1 |
| Title of publication |
Crystal Structures of Bu4N[Pt(ppy)Cl2], Et4N[Pt(tpy)Cl2] and [Pt(ppy)en]Cl (ppy = N,C'-Chelated 2-Phenylpyridinate, tpy = N,C'-Chelated 2-(2'-Thienyl)pyridinate, en = N,N'-Chelated 1,2-Diaminoethane). |
| Authors of publication |
Kvam, Per-Inge; Engebretsen, Thoralf; Maartmann-Moe, Knut; Songstad, Jon |
| Journal of publication |
Acta Chemica Scandinavica |
| Year of publication |
1996 |
| Journal volume |
50 |
| Pages of publication |
107 - 113 |
| a |
8.996 ± 0.002 Å |
| b |
25.085 ± 0.002 Å |
| c |
9.103 ± 0.002 Å |
| α |
90° |
| β |
110.6 ± 0.01° |
| γ |
90° |
| Cell volume |
1922.9 ± 0.6 Å3 |
| Ambient diffraction temperature |
93 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for significantly intense reflections |
0.029 |
| Weighted residual factors for significantly intense reflections |
0.031 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.341 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1557421.html