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Information card for entry 1557453
Preview
Coordinates | 1557453.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H72 Cl4 Ga N3 P |
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Calculated formula | C54 H72 Cl4 Ga N3 P |
SMILES | [Ga](Cl)(Cl)([Cl-])Cl.P(C(=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)c1ccccc1)=C1N(C(CC1(C)C)(C)C)c1c(cccc1C(C)C)C(C)C |
Title of publication | Isolation of singlet carbene derived 2-phospha-1,3-butadienes and their sequential one-electron oxidation to radical cations and dications |
Authors of publication | Sharma, Mahendra K.; Blomeyer, Sebastian; Glodde, Timo; Neumann, Beate; Stammler, Hans-Georg; Hinz, Alexander; van Gastel, Maurice; Ghadwal, Rajendra S. |
Journal of publication | Chemical Science |
Year of publication | 2020 |
Journal volume | 11 |
Journal issue | 7 |
Pages of publication | 1975 - 1984 |
a | 11.5123 ± 0.0002 Å |
b | 12.8811 ± 0.0002 Å |
c | 37.2397 ± 0.0005 Å |
α | 90° |
β | 97.724 ± 0.001° |
γ | 90° |
Cell volume | 5472.21 ± 0.15 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0642 |
Residual factor for significantly intense reflections | 0.0544 |
Weighted residual factors for significantly intense reflections | 0.1072 |
Weighted residual factors for all reflections included in the refinement | 0.1106 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.174 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1557453.html
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Users of the data should acknowledge the original authors of the
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