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Information card for entry 1557459
Preview
Coordinates | 1557459.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H84 Ag2 Li2 N4 O2 |
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Calculated formula | C56 H84 Ag2 Li2 N4 O2 |
SMILES | [Ag]1c2ccccc2C(=[O][Li][N]2([Ag][N]3(C(C)(CCCC3(C)C)C)[Li][O]=C(N(C(C)C)C(C)C)c3ccccc13)C(C)(CCCC2(C)C)C)N(C(C)C)C(C)C.c1ccccc1.c1ccccc1 |
Title of publication | Lipshutz-type bis(amido)argentates for directed ortho argentation |
Authors of publication | Tezuka, Noriyuki; Hirano, Keiichi; Peel, Andrew J.; Wheatley, Andrew E. H.; Miyamoto, Kazunori; Uchiyama, Masanobu |
Journal of publication | Chemical Science |
Year of publication | 2020 |
Journal volume | 11 |
Journal issue | 7 |
Pages of publication | 1855 - 1861 |
a | 13.3743 ± 0.0002 Å |
b | 18.2477 ± 0.0002 Å |
c | 22.9463 ± 0.0003 Å |
α | 90° |
β | 103.316 ± 0.002° |
γ | 90° |
Cell volume | 5449.49 ± 0.13 Å3 |
Cell temperature | 93 K |
Ambient diffraction temperature | 93 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0397 |
Residual factor for significantly intense reflections | 0.0362 |
Weighted residual factors for significantly intense reflections | 0.0944 |
Weighted residual factors for all reflections included in the refinement | 0.0963 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.131 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1557459.html
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