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Information card for entry 1557840
Preview
Coordinates | 1557840.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H90 Al2 N4 |
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Calculated formula | C54 H90 Al2 N4 |
SMILES | [Al]1([Al](c2c(cc(cc2C(C)C)C(C)C)C(C)C)(=C2N(C(=C(N2C(C)C)C)C)C(C)C)CC1)(c1c(cc(cc1C(C)C)C(C)C)C(C)C)=C1N(C(=C(N1C(C)C)C)C)C(C)C |
Title of publication | Dialumenes ‒ aryl vs. silyl stabilisation for small molecule activation and catalysis |
Authors of publication | Weetman, Catherine; Porzelt, Amelie; Bag, Prasenjit; Hanusch, Franziska; Inoue, Shigeyoshi |
Journal of publication | Chemical Science |
Year of publication | 2020 |
Journal volume | 11 |
Journal issue | 18 |
Pages of publication | 4817 - 4827 |
a | 12.4062 ± 0.001 Å |
b | 18.1378 ± 0.0016 Å |
c | 24.62 ± 0.002 Å |
α | 90° |
β | 101.846 ± 0.003° |
γ | 90° |
Cell volume | 5422 ± 0.8 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0949 |
Residual factor for significantly intense reflections | 0.0645 |
Weighted residual factors for significantly intense reflections | 0.1672 |
Weighted residual factors for all reflections included in the refinement | 0.1923 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1557840.html
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