Information card for entry 1558511

Structure parameters

• Formula: C19 H25 B F4 Te
• Calculated formula: C19 H25 B F4 Te
• Title of publication: Redox-controlled chalcogen-bonding at tellurium: Impact on Lewis acidity and chloride anion transport properties
• Authors of publication: Zhou, Benyu; Gabbaï, François P.
• Journal of publication: Chemical Science
• Year of publication: 2020
• a: 11.7351 ± 0.0011 Å
• b: 15.9629 ± 0.0019 Å
• c: 21.44 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 4016.3 ± 0.8 ų
• Cell temperature: 110 K
• Ambient diffraction temperature: 110 K
• Number of distinct elements: 5
• Space group number: 61
• Hermann-Mauguin space group symbol: P b c a
• Hall space group symbol: -P 2ac 2ab
• Residual factor for all reflections: 0.0823
• Residual factor for significantly intense reflections: 0.0669
• Weighted residual factors for significantly intense reflections: 0.168
• Weighted residual factors for all reflections included in the refinement: 0.1889
• Goodness-of-fit parameter for all reflections included in the refinement: 1.075
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No