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Information card for entry 1558906
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Coordinates | 1558906.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | DUT-148 |
---|---|
Formula | C42 H22 Cu2 N2 O10 |
Calculated formula | C42 H22 Cu2 N2 O10 |
Title of publication | Engineering micromechanics of soft porous crystals for negative gas adsorption |
Authors of publication | Krause, Simon; Evans, Jack D.; Bon, Volodymyr; Senkovska, Irene; Ehrling, Sebastian; Iacomic, Paul; Többens, Daniel M; Llewellyn, Philip L.; Wallacher, Dirk; Weiss, Manfred S.; Zheng, Bin; Yot, Pascal G.; Maurin, Guillaume; Coudert, François-Xavier; Kaskel, Stefan |
Journal of publication | Chemical Science |
Year of publication | 2020 |
a | 46.54 ± 0.005 Å |
b | 46.54 ± 0.005 Å |
c | 46.54 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 100804 ± 19 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 225 |
Hermann-Mauguin space group symbol | F m -3 m |
Hall space group symbol | -F 4 2 3 |
Residual factor for all reflections | 0.1102 |
Residual factor for significantly intense reflections | 0.0676 |
Weighted residual factors for significantly intense reflections | 0.2043 |
Weighted residual factors for all reflections included in the refinement | 0.249 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.89499 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1558906.html
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