Information card for entry 1559211
Chemical name |
2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
Formula |
C26 H48 N4 Si3 |
Calculated formula |
C26 H48 N4 Si3 |
SMILES |
[Si]([Si]([Si](C)(C)C)(c1cc(cc(c1)N(C)C)N(C)C)c1cc(cc(c1)N(C)C)N(C)C)(C)(C)C |
Title of publication |
2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
Authors of publication |
Mizuhata, Yoshiyuki; Iwai, Kento; Tokitoh, Norihiro |
Journal of publication |
IUCrData |
Year of publication |
2020 |
Journal volume |
5 |
Journal issue |
9 |
Pages of publication |
x201299 |
a |
20.6543 ± 0.0003 Å |
b |
8.365 ± 0.0001 Å |
c |
17.5215 ± 0.0003 Å |
α |
90° |
β |
97.371 ± 0.002° |
γ |
90° |
Cell volume |
3002.23 ± 0.08 Å3 |
Cell temperature |
103 ± 2 K |
Ambient diffraction temperature |
103 ± 2 K |
Number of distinct elements |
4 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.0397 |
Residual factor for significantly intense reflections |
0.0325 |
Weighted residual factors for significantly intense reflections |
0.0817 |
Weighted residual factors for all reflections included in the refinement |
0.0863 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.038 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/1559211.html