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Information card for entry 1559641
Preview
Coordinates | 1559641.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51 H33 N O |
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Calculated formula | C51 H33 N O |
SMILES | O=C1c2c(C3(c4c1cccc4)c1c(c4c3cccc4)cccc1)cc(N1c3c(C(c4ccccc4)(c4c1cccc4)c1ccccc1)cccc3)cc2 |
Title of publication | Using fluorene to lock electronically active moieties in thermally activated delayed fluorescence emitters for high-performance non-doped organic light-emitting diodes with suppressed roll-off. |
Authors of publication | Wu, Lin; Wang, Kai; Wang, Cheng; Fan, Xiao-Chun; Shi, Yi-Zhong; Zhang, Xiang; Zhang, Shao-Li; Ye, Jun; Zheng, Cai-Jun; Li, Yan-Qing; Yu, Jia; Ou, Xue-Mei; Zhang, Xiao-Hong |
Journal of publication | Chemical science |
Year of publication | 2020 |
Journal volume | 12 |
Journal issue | 4 |
Pages of publication | 1495 - 1502 |
a | 12.0934 ± 0.0006 Å |
b | 13.1272 ± 0.0007 Å |
c | 13.4509 ± 0.0007 Å |
α | 118.019 ± 0.001° |
β | 90.255 ± 0.002° |
γ | 105.741 ± 0.002° |
Cell volume | 1792.4 ± 0.16 Å3 |
Cell temperature | 298 K |
Ambient diffraction temperature | 298 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0649 |
Residual factor for significantly intense reflections | 0.0454 |
Weighted residual factors for significantly intense reflections | 0.1109 |
Weighted residual factors for all reflections included in the refinement | 0.1225 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1559641.html
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