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Information card for entry 1560655
Preview
| Coordinates | 1560655.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cs2 H4 O11 Se3 Zn2 |
|---|---|
| Calculated formula | Cs2 H4 O11 Se3 Zn2 |
| Title of publication | Variable dimensionality and framework found in a series of quaternary zinc selenites, A 2 Zn 3 (SeO 3 ) 4 · x H 2 O (A = Na, Rb, and Cs; 0≤ x ≤1) and Cs 2 Zn 2 (SeO 3 ) 3 ·2H 2 O |
| Authors of publication | Lü, Minfeng; Jo, Hongil; Oh, Seung-Jin; Ok, Kang Min |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2017 |
| Journal volume | 245 |
| Pages of publication | 1 - 9 |
| a | 7.5093 ± 0.0003 Å |
| b | 9.7918 ± 0.0004 Å |
| c | 9.9128 ± 0.0004 Å |
| α | 77.0869 ± 0.0019° |
| β | 72.8487 ± 0.0018° |
| γ | 88.32 ± 0.002° |
| Cell volume | 678.33 ± 0.05 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0698 |
| Residual factor for significantly intense reflections | 0.0359 |
| Weighted residual factors for significantly intense reflections | 0.0334 |
| Weighted residual factors for all reflections included in the refinement | 0.0368 |
| Goodness-of-fit parameter for significantly intense reflections | 1.29 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.13 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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