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Information card for entry 1561190
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Coordinates | 1561190.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H162 K2 N4 O24 Si6 U2 |
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Calculated formula | C72 H162 K2 N4 O24 Si6 U2 |
Title of publication | Single metal four-electron reduction by U(ii) and masked "U(ii)" compounds. |
Authors of publication | Modder, Dieuwertje K.; Palumbo, Chad T.; Douair, Iskander; Scopelliti, Rosario; Maron, Laurent; Mazzanti, Marinella |
Journal of publication | Chemical science |
Year of publication | 2021 |
Journal volume | 12 |
Journal issue | 17 |
Pages of publication | 6153 - 6158 |
a | 14.382 ± 0.002 Å |
b | 17.661 ± 0.003 Å |
c | 21.819 ± 0.004 Å |
α | 90° |
β | 92.012 ± 0.009° |
γ | 90° |
Cell volume | 5538.6 ± 1.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100.15 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.117 |
Residual factor for significantly intense reflections | 0.0592 |
Weighted residual factors for significantly intense reflections | 0.1241 |
Weighted residual factors for all reflections included in the refinement | 0.1665 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.135 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1561190.html
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