Crystallography Open Database

Information card for entry 1561562

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Coordinates	1561562.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	Cu2.06 O11 Ta4
Calculated formula	Cu2.05 O11 Ta4
Title of publication	Flux-mediated syntheses, structural characterization and low-temperature polymorphism of the p-type semiconductor Cu2Ta4O11
Authors of publication	King, Nacole; Sullivan, Ian; Watkins-Curry, Pilanda; Chan, Julia Y.; Maggard, Paul A.
Journal of publication	Journal of Solid State Chemistry
Year of publication	2016
Journal volume	236
Pages of publication	10 - 18
a	10.7337 ± 0.0014 Å
b	6.2506 ± 0.0003 Å
c	12.8869 ± 0.0014 Å
α	90°
β	106.07 ± 0.004°
γ	90°
Cell volume	830.82 ± 0.15 Å³
Ambient diffraction temperature	300 K
Ambient diffracton pressure	100 kPa
Number of distinct elements	3
Space group number	9
Hermann-Mauguin space group symbol	C 1 c 1
Hall space group symbol	C -2yc
Weighted residual factors for significantly intense reflections	0.08587
RFsqd	0.09653
Goodness-of-fit parameter for all reflections	2.517
Method of determination	powder diffraction
Diffraction radiation probe	x-ray
Diffraction radiation wavelength	1.5406 Å
Diffraction radiation type	Kα~1,2~
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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