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Information card for entry 1561964
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Coordinates | 1561964.cif |
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Original paper (by DOI) | HTML |
Formula | Eu2 Na8 S12 Si4 |
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Calculated formula | Eu2 Na8 S12 Si4 |
Title of publication | Structural, optical, and magnetic properties of Na8Eu2(Si2S6)2 and Na8Eu2(Ge2S6)2: Europium(II) quaternary chalcogenides that contain an ethane-like (Si2S6)6− or (Ge2S6)6− moiety |
Authors of publication | Choudhury, Amitava; Ghosh, Kartik; Grandjean, Fernande; Long, Gary J.; Dorhout, Peter K. |
Journal of publication | Journal of Solid State Chemistry |
Year of publication | 2015 |
Journal volume | 226 |
Pages of publication | 74 - 80 |
a | 6.7784 ± 0.0014 Å |
b | 11.68 ± 0.002 Å |
c | 7.6622 ± 0.0016 Å |
α | 90° |
β | 107.271 ± 0.003° |
γ | 90° |
Cell volume | 579.3 ± 0.2 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.0671 |
Residual factor for significantly intense reflections | 0.0606 |
Weighted residual factors for significantly intense reflections | 0.1375 |
Weighted residual factors for all reflections included in the refinement | 0.14 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.392 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1561964.html
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