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Information card for entry 1562353
Preview
Coordinates | 1562353.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C62.5 H75 Cl N4 |
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Calculated formula | C62.5 H75 Cl N4 |
SMILES | ClCCl.N(c1ccc(cc1)/C(=C(/c1ccc(N(c2ccc(cc2)C(C)(C)C)c2ccc(cc2)C(C)(C)C)cc1)C#N)C#N)(c1ccc(C(C)(C)C)cc1)c1ccc(C(C)(C)C)cc1.C(CCCC)C |
Title of publication | Organic Nanoparticles-Assisted Low-Power STED Nanoscopy. |
Authors of publication | Man, Zhongwei; Cui, Hongtu; Lv, Zheng; Xu, Zhenzhen; Wu, Zhaoyang; Wu, Yishi; Liao, Qing; Liu, Meihui; Xi, Peng; Zheng, Lemin; Fu, Hongbing |
Journal of publication | Nano letters |
Year of publication | 2021 |
Journal volume | 21 |
Journal issue | 8 |
Pages of publication | 3487 - 3494 |
a | 14.5082 ± 0.0004 Å |
b | 20.329 ± 0.0006 Å |
c | 37.5089 ± 0.0012 Å |
α | 90° |
β | 97.29 ± 0.004° |
γ | 90° |
Cell volume | 10973.3 ± 0.6 Å3 |
Cell temperature | 100 ± 0.1 K |
Ambient diffraction temperature | 100 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1158 |
Residual factor for significantly intense reflections | 0.0932 |
Weighted residual factors for significantly intense reflections | 0.2633 |
Weighted residual factors for all reflections included in the refinement | 0.2919 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1562353.html
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Users of the data should acknowledge the original authors of the
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