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Information card for entry 1563489
Preview
Coordinates | 1563489.cif |
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Original paper (by DOI) | HTML |
Formula | Cu0.4 Ga0.6 In0.6 Se2 |
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Calculated formula | Cu0.4 Ga0.6 In0.6 Se2 |
Title of publication | Structural investigation of the Cu2Se‒In2Se3‒Ga2Se3 phase diagram, X-ray photoemission and optical properties of the Cu1−z(In0.5Ga0.5)1+z/3Se2 compounds |
Authors of publication | Souilah, M.; Lafond, A.; Guillot-Deudon, C.; Harel, S.; Evain, M. |
Journal of publication | Journal of Solid State Chemistry |
Year of publication | 2010 |
Journal volume | 183 |
Journal issue | 10 |
Pages of publication | 2274 - 2280 |
a | 5.63351 ± 0.00013 Å |
b | 5.63351 ± 0.00013 Å |
c | 11.2411 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 356.752 ± 0.015 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 121 |
Hermann-Mauguin space group symbol | I -4 2 m |
Hall space group symbol | I -4 2 |
Residual factor for all reflections | 0.0778 |
Residual factor for significantly intense reflections | 0.0505 |
Weighted residual factors for significantly intense reflections | 0.1283 |
Weighted residual factors for all reflections included in the refinement | 0.1493 |
Goodness-of-fit parameter for significantly intense reflections | 1.85 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.9 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1563489.html
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