Information card for entry 1563557
| Formula |
Bi Ge K S4 |
| Calculated formula |
Bi Ge K S4 |
| Title of publication |
KBiMS4 (M=Si, Ge): Synthesis, structure, and electronic structure |
| Authors of publication |
Mei, Dajiang; Lin, Zheshuai; Bai, Lei; Yao, Jiyong; Fu, Peizhen; Wu, Yicheng |
| Journal of publication |
Journal of Solid State Chemistry |
| Year of publication |
2010 |
| Journal volume |
183 |
| Journal issue |
7 |
| Pages of publication |
1640 - 1644 |
| a |
6.5981 ± 0.0013 Å |
| b |
6.8149 ± 0.0014 Å |
| c |
17.284 ± 0.004 Å |
| α |
90° |
| β |
108.46 ± 0.03° |
| γ |
90° |
| Cell volume |
737.2 ± 0.3 Å3 |
| Cell temperature |
93 ± 2 K |
| Ambient diffraction temperature |
93 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0386 |
| Residual factor for significantly intense reflections |
0.0296 |
| Weighted residual factors for significantly intense reflections |
0.055 |
| Weighted residual factors for all reflections included in the refinement |
0.0571 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.934 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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