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Information card for entry 1563574
Preview
| Coordinates | 1563574.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | YbPt2Si |
|---|---|
| Chemical name | YbPt2Si |
| Formula | Pt8 Si4 Yb4 |
| Calculated formula | Pt8 Si4 Yb4 |
| Title of publication | X-ray structural study of intermetallic alloys RT2Si and RTSi2 (R=rare earth, T=noble metal) |
| Authors of publication | Gribanov, Alexander; Grytsiv, Andriy; Rogl, Peter; Seropegin, Yurii; Giester, Gerald |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2010 |
| Journal volume | 183 |
| Journal issue | 6 |
| Pages of publication | 1278 - 1289 |
| a | 7.1841 ± 0.0002 Å |
| b | 6.9151 ± 0.0002 Å |
| c | 5.4098 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 268.752 ± 0.015 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0289 |
| Residual factor for significantly intense reflections | 0.025 |
| Weighted residual factors for significantly intense reflections | 0.0645 |
| Weighted residual factors for all reflections included in the refinement | 0.0667 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.092 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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