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Information card for entry 1564050
Preview
Coordinates | 1564050.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H55 N O10 P2 Ru2 Si2 |
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Calculated formula | C52 H55 N O10 P2 Ru2 Si2 |
SMILES | [Ru]12([Ru]([P](c3ccccc3)(c3ccccc3)c3ccccc3)(C#[O])(C#[O])([O]=C(CO[Si](C)(C)C)O1)OC(CO[Si](C)(C)C)=[O]2)([P](c1ccccc1)(c1ccccc1)c1ccccc1)(C#[O])C#[O].CC#N |
Title of publication | Encapsulating ruthenium in silica using a single source precursor: Differing outcomes for a cycloaddition reaction |
Authors of publication | Barik, Chandan Kr; Ganguly, Rakesh; Garcia, Felipe; Leong, Weng Kee |
Journal of publication | Inorganica Chimica Acta |
Year of publication | 2020 |
Journal volume | 512 |
Pages of publication | 119833 |
a | 10.5028 ± 0.0003 Å |
b | 13.6946 ± 0.0004 Å |
c | 20.5244 ± 0.0006 Å |
α | 72.1988 ± 0.0016° |
β | 85.7229 ± 0.0017° |
γ | 71.1619 ± 0.0014° |
Cell volume | 2659.21 ± 0.14 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0477 |
Residual factor for significantly intense reflections | 0.0336 |
Weighted residual factors for significantly intense reflections | 0.0802 |
Weighted residual factors for all reflections included in the refinement | 0.0885 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1564050.html
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