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Information card for entry 1565104
Preview
Coordinates | 1565104.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H79 Cr3 N7 Si3 |
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Calculated formula | C56 H79 Cr3 N7 Si3 |
SMILES | [Cr]12345[Cr]67[N]4(C4CC8[N]92[Cr]1([N]3([Si](C)(C)C(C)(C)C)c1c9cccc1)([N]6(C(C4)C8)c1c(N7[Si](C)(C)C(C)(C)C)cccc1)C#[N]Cc1ccccc1)c1c(N5[Si](C)(C)C(C)(C)C)cccc1.c1ccccc1 |
Title of publication | Revealing Redox Isomerism in Trichromium Imides by Anomalous Diffraction |
Authors of publication | Bartholomew, Amymarie K.; Chen, Yu-Sheng; Grass Wang, Suyin; Bu, Wei; Dong, Yuyang; Juda, Cristin E.; Betley, Theodore; Anderton, Kevin J.; Musgrave, Rebecca A. |
Journal of publication | Chemical Science |
Year of publication | 2021 |
a | 13.3541 ± 0.0005 Å |
b | 29.4601 ± 0.0011 Å |
c | 14.08 ± 0.0005 Å |
α | 90° |
β | 93.271 ± 0.001° |
γ | 90° |
Cell volume | 5530.2 ± 0.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296.15 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0548 |
Residual factor for significantly intense reflections | 0.0398 |
Weighted residual factors for significantly intense reflections | 0.1019 |
Weighted residual factors for all reflections included in the refinement | 0.1103 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 0.41328 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1565104.html
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Users of the data should acknowledge the original authors of the
structural data.