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Information card for entry 1565761
Preview
Coordinates | 1565761.cif |
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Original paper (by DOI) | HTML |
Formula | C12 H20 N2 Pb S4 |
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Calculated formula | C12 H20 N2 Pb S4 |
SMILES | [Pb]12([S]=C(S1)N1CCCCC1)[S]=C(S2)N1CCCCC1 |
Title of publication | Morphological influence of deposition routes on lead sulfide thin films |
Authors of publication | Mlowe, Sixberth; Shombe, Ginena B.; Akerman, Matthew P.; Mubofu, Egid B.; O'Brien, Paul; Mashazi, Philani; Nyokong, Tebello; Revaprasadu, Neerish |
Journal of publication | Inorganica Chimica Acta |
Year of publication | 2019 |
Journal volume | 498 |
Pages of publication | 119116 |
a | 16.086 ± 0.003 Å |
b | 22.565 ± 0.004 Å |
c | 4.4482 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1614.6 ± 0.5 Å3 |
Cell temperature | 102 ± 2 K |
Ambient diffraction temperature | 102 ± 2 K |
Number of distinct elements | 5 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n 21 a |
Hall space group symbol | P -2ac -2n |
Residual factor for all reflections | 0.0226 |
Residual factor for significantly intense reflections | 0.0202 |
Weighted residual factors for significantly intense reflections | 0.042 |
Weighted residual factors for all reflections included in the refinement | 0.0427 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.909 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1565761.html
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