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Information card for entry 1565932
Preview
Coordinates | 1565932.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C76 H90 P2 Pt2 S4 |
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Calculated formula | C76 H90 P2 Pt2 S4 |
SMILES | C12(CC3CC(C1)CC(C2)C3)[S]1[Pt]([P](c2ccccc2)(c2ccccc2)c2ccccc2)(SC23CC4CC(C2)CC(C3)C4)[S](C23CC4CC(C2)CC(C3)C4)[Pt]1([P](c1ccccc1)(c1ccccc1)c1ccccc1)SC12CC3CC(C1)CC(C2)C3 |
Title of publication | Atomically precise structures of Pt<sub>2</sub>(S-Adam)<sub>4</sub>(PPh<sub>3</sub>)<sub>2</sub> complexes and catalytic application in propane dehydrogenation. |
Authors of publication | Lin, Xinzhang; Zhang, Junying; Tang, Jie; Yang, Yang; Liu, Chao; Huang, Jiahui |
Journal of publication | Nanoscale |
Year of publication | 2022 |
Journal volume | 14 |
Journal issue | 6 |
Pages of publication | 2482 - 2489 |
a | 14.31 ± 0.003 Å |
b | 17.506 ± 0.004 Å |
c | 14.665 ± 0.003 Å |
α | 90° |
β | 100.92 ± 0.03° |
γ | 90° |
Cell volume | 3607.2 ± 1.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0303 |
Residual factor for significantly intense reflections | 0.0288 |
Weighted residual factors for significantly intense reflections | 0.0761 |
Weighted residual factors for all reflections included in the refinement | 0.0776 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1565932.html
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