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Information card for entry 1566763
Preview
Coordinates | 1566763.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H80 Al K N2 O5 Se Si2 |
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Calculated formula | C53 H80 Al K N2 O5 Se Si2 |
Title of publication | Carbon–chalcogen bond formation initiated by [Al(NONDipp)(E)]− anions containing Al–E{16} (E{16} = S, Se) multiple bonds |
Authors of publication | Evans, Matthew J.; Anker, Mathew D.; McMullin, Claire L.; Neale, Samuel E.; Rajabi, Nasir A.; Coles, Martyn P. |
Journal of publication | Chemical Science |
Year of publication | 2022 |
a | 9.75833 ± 0.00009 Å |
b | 31.8983 ± 0.0003 Å |
c | 17.54162 ± 0.00015 Å |
α | 90° |
β | 92.6949 ± 0.0008° |
γ | 90° |
Cell volume | 5454.21 ± 0.09 Å3 |
Cell temperature | 120.01 ± 0.1 K |
Ambient diffraction temperature | 120.01 ± 0.1 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0361 |
Residual factor for significantly intense reflections | 0.0311 |
Weighted residual factors for significantly intense reflections | 0.0761 |
Weighted residual factors for all reflections included in the refinement | 0.0789 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1566763.html
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