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Information card for entry 1568762
Preview
| Coordinates | 1568762.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H34 O4 Si |
|---|---|
| Calculated formula | C27 H34 O4 Si |
| SMILES | [Si](c1ccccc1)(C)(C)C(=C)C[C@@H]1[C@]2(C)C[C@H]3C(=O)[C@@H]4[C@@](O)(C)C[C@@H]5OC(=O)[C@@H]([C@H]45)[C@@]23C1 |
| Title of publication | Total synthesis of (-)-scabrolide A and (-)-yonarolide. |
| Authors of publication | Hafeman, Nicholas J.; Loskot, Steven A.; Reimann, Christopher E.; Pritchett, Beau P.; Virgil, Scott C.; Stoltz, Brian M. |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 18 |
| Pages of publication | 4745 - 4758 |
| a | 6.9085 ± 0.0014 Å |
| b | 10.3765 ± 0.0019 Å |
| c | 17.058 ± 0.003 Å |
| α | 90° |
| β | 90.92 ± 0.007° |
| γ | 90° |
| Cell volume | 1222.7 ± 0.4 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0511 |
| Residual factor for significantly intense reflections | 0.0401 |
| Weighted residual factors for significantly intense reflections | 0.0827 |
| Weighted residual factors for all reflections included in the refinement | 0.0865 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1568762.html
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Users of the data should acknowledge the original authors of the
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