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Information card for entry 1568830
Preview
| Coordinates | 1568830.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C129 H162 Ag20 F30 N2 O24 S10 |
|---|---|
| Calculated formula | C129 H162 Ag20 F30 N2 O24 S10 |
| Title of publication | Luminescent [CO<sub>2</sub>@Ag<sub>20</sub>(SAdm)<sub>10</sub>(CF<sub>3</sub>COO)<sub>10</sub>(DMA)<sub>2</sub>] nanocluster: synthetic strategy and its implication towards white light emission. |
| Authors of publication | Biswas, Sourav; Das, Anish Kumar; Sardar, Avirup; Manna, Surya Sekhar; Mondal, Pradip Kumar; Polentarutti, Maurizio; Pathak, Biswarup; Mandal, Sukhendu |
| Journal of publication | Nanoscale |
| Year of publication | 2023 |
| Journal volume | 15 |
| Journal issue | 18 |
| Pages of publication | 8377 - 8386 |
| a | 15.085 ± 0.003 Å |
| b | 19.98 ± 0.004 Å |
| c | 27.634 ± 0.006 Å |
| α | 90° |
| β | 96.34 ± 0.03° |
| γ | 90° |
| Cell volume | 8278 ± 3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1625 |
| Residual factor for significantly intense reflections | 0.1333 |
| Weighted residual factors for significantly intense reflections | 0.3906 |
| Weighted residual factors for all reflections included in the refinement | 0.4158 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.517 |
| Diffraction radiation wavelength | 0.6199 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1568830.html
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Users of the data should acknowledge the original authors of the
structural data.