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Information card for entry 1569003
Preview
| Coordinates | 1569003.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H52 Cl6 Cu4 N8 O12 P6 |
|---|---|
| Calculated formula | C24 H52 Cl6 Cu4 N8 O12 P6 |
| SMILES | c1c(ccc(c1)[NH3+])[NH3+].c1(ccc(cc1)[NH3+])[NH3+].[Cl]1[Cu]234(O[PH2]=O)[Cl][Cu]564(O[PH2]=O)[Cl][Cu]45(O[PH2]=O)([Cl][Cu]134(O[PH2]=O)[Cl]6)[Cl]2.c1(ccc(cc1)[NH3+])[NH3+].O=[PH2][O-].[O-][PH2]=O.c1c(ccc(c1)[NH3+])[NH3+] |
| Title of publication | Photophysical studies for Cu(i)-based halides: broad excitation bands and highly efficient single-component warm white-light-emitting diodes. |
| Authors of publication | Zhou, Shuigen; Chen, Yihao; Li, Kailei; Liu, Xiaowei; Zhang, Ting; Shen, Wei; Li, Ming; Zhou, Lei; He, Rongxing |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 20 |
| Pages of publication | 5415 - 5424 |
| a | 13.6165 ± 0.0006 Å |
| b | 25.2859 ± 0.001 Å |
| c | 13.6152 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4687.8 ± 0.3 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 7 |
| Space group number | 68 |
| Hermann-Mauguin space group symbol | C c c a :2 |
| Hall space group symbol | -C 2a 2ac |
| Residual factor for all reflections | 0.0319 |
| Residual factor for significantly intense reflections | 0.0271 |
| Weighted residual factors for significantly intense reflections | 0.062 |
| Weighted residual factors for all reflections included in the refinement | 0.0645 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1569003.html
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Users of the data should acknowledge the original authors of the
structural data.