Information card for entry 1569056

Structure parameters

• Formula: C48 H69 Cl3 O6 Si3
• Calculated formula: C48 H69 Cl3 O6 Si3
• SMILES: Cl[Si](OC(C)(C)C)(OC(C)(C)C)c1c(c2cc(cc(c2)c2ccccc2[Si](Cl)(OC(C)(C)C)OC(C)(C)C)c2ccccc2[Si](Cl)(OC(C)(C)C)OC(C)(C)C)cccc1
• Title of publication: Isolation and redox reactivity of cerium complexes in four redox states.
• Authors of publication: Hsueh, Fang-Che; Rajeshkumar, Thayalan; Maron, Laurent; Scopelliti, Rosario; Sienkiewicz, Andrzej; Mazzanti, Marinella
• Journal of publication: Chemical science
• Year of publication: 2023
• Journal volume: 14
• Journal issue: 22
• Pages of publication: 6011 - 6021
• a: 13.7393 ± 0.0004 Å
• b: 13.7546 ± 0.0005 Å
• c: 14.7849 ± 0.0006 Å
• α: 112.76 ± 0.004°
• β: 91.008 ± 0.003°
• γ: 93.713 ± 0.003°
• Cell volume: 2568.3 ± 0.18 ų
• Cell temperature: 140 ± 0.11 K
• Ambient diffraction temperature: 140 ± 0.11 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0477
• Residual factor for significantly intense reflections: 0.0362
• Weighted residual factors for significantly intense reflections: 0.0908
• Weighted residual factors for all reflections included in the refinement: 0.0979
• Goodness-of-fit parameter for all reflections included in the refinement: 1.026
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No