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Information card for entry 1569354
Preview
| Coordinates | 1569354.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Qx-m-4F |
|---|---|
| Formula | C104 H110 F6 N8 O2 S4 |
| Calculated formula | C105 H111 Cl3 F6 N8 O2 S4 |
| Title of publication | Selective halogenation of central and end-units of nonfullerene acceptors enables enhanced molecular packing and photovoltaic performance |
| Authors of publication | Xie, Meiling; Shi, Yanan; Zhu, Lingyun; Zhang, Jianqi; Cheng, Qian; Zhang, Hao; Yan, Yangjun; Zhu, Mingquan; Zhou, Huiqiong; Lu, Kun; Wei, Zhixiang |
| Journal of publication | Energy & Environmental Science |
| Year of publication | 2023 |
| Journal volume | 16 |
| Journal issue | 8 |
| Pages of publication | 3543 - 3551 |
| a | 24.3943 ± 0.0008 Å |
| b | 14.1219 ± 0.0004 Å |
| c | 29.0635 ± 0.0008 Å |
| α | 90° |
| β | 103.837 ± 0.003° |
| γ | 90° |
| Cell volume | 9721.6 ± 0.5 Å3 |
| Cell temperature | 180 ± 0.1 K |
| Ambient diffraction temperature | 180 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/n 1 |
| Hall space group symbol | -P 2yac |
| Residual factor for all reflections | 0.1044 |
| Residual factor for significantly intense reflections | 0.0812 |
| Weighted residual factors for significantly intense reflections | 0.2083 |
| Weighted residual factors for all reflections included in the refinement | 0.2236 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1569354.html
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Users of the data should acknowledge the original authors of the
structural data.