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Information card for entry 1569396
Preview
| Coordinates | 1569396.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | GUF-1 |
|---|---|
| Formula | C37.6 H40.4 O15.5 Sc2 |
| Calculated formula | C33.96 H25.84 O10 Sc2 |
| Title of publication | Pressure-induced postsynthetic cluster anion substitution in a MIL-53 topology scandium metal-organic framework. |
| Authors of publication | Thom, Alexander J. R.; Turner, Gemma F.; Davis, Zachary H.; Ward, Martin R.; PakamorÄ—, Ignas; Hobday, Claire L.; Allan, David R.; Warren, Mark R.; Leung, Wai L. W.; Oswald, Iain D. H.; Morris, Russell E.; Moggach, Stephen A.; Ashbrook, Sharon E.; Forgan, Ross S. |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 28 |
| Pages of publication | 7716 - 7724 |
| a | 7.0143 ± 0.0012 Å |
| b | 21.941 ± 0.007 Å |
| c | 13.6972 ± 0.0019 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2108 ± 0.8 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Cell measurement pressure | 4980000 kPa |
| Ambient diffracton pressure | 4980000 kPa |
| Number of distinct elements | 4 |
| Space group number | 67 |
| Hermann-Mauguin space group symbol | C m m a |
| Hall space group symbol | -C 2a 2 |
| Residual factor for all reflections | 0.125 |
| Residual factor for significantly intense reflections | 0.1109 |
| Weighted residual factors for significantly intense reflections | 0.3232 |
| Weighted residual factors for all reflections included in the refinement | 0.3328 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.216 |
| Diffraction radiation wavelength | 0.4589 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1569396.html
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Users of the data should acknowledge the original authors of the
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