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Information card for entry 1569762
Preview
| Coordinates | 1569762.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C204 H158 Ag28 P6 Pt S36 |
|---|---|
| Calculated formula | C204 H158 Ag28 P6 Pt S36 |
| SMILES | c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.c1ccc(cc1)[P]([Ag]123[S]45[Ag]678[Ag]9%10%11%12[Pt]%13%14%15%16[Ag]%17%18%19%20[Ag]%21%22%23%13[S]%13%24c%25cc(cc(c%25)S)[S]%25[Ag]%26%27%28[Ag]%29%30%31[Ag]%32%25%26[S]%30c%25cc(cc(c%25)S)[S]%25%26[Ag]%30%33[Ag]%34%35%36[S]%37%29c%29cc(cc(c%29)S)[S]%29[Ag]%38%39%40[Ag]%41%42([Ag]%25%29%38[S]%41c%25cc(cc(c%25)S)[S]%25%17[Ag]%26[S]%17%32[Ag]%16%20%23%35[Ag]%11%15%22%34[S]%11%28[Ag]%15%13[Ag]%136%10[Ag]61%19%21[Ag]1%10%16%19[Ag]%20%21%25[Ag]%241([S]%16c1cc(cc(c1)S)[S]%15%13[Ag]1%13%15[Ag]%165([Ag]51([S]9(c1cc(cc(c1)S)[S]%27%31)[Ag]%37([P](c1ccccc1)(c1ccccc1)c1ccccc1)[S]%40([Ag]8%12%33%36[Ag]7%14%18%30[S]3%42c1cc(cc(c1)S)[S]%19%20)c1cc(cc(c1)S)[S]%165)[S]%15c1cc%11cc(c1)S)[S]%13c1cc(cc(c1)S)[S]26%10)[S]%21c1cc%17cc(c1)S)[S]%39c1cc4cc(c1)S)(c1ccccc1)c1ccccc1.c1c(cccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.c1c(cccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Stepwise construction of Ag<sub>29</sub> nanocluster-based hydrogen evolution electrocatalysts. |
| Authors of publication | Shen, Honglei; Zhu, Qingtao; Xu, Jiawei; Ni, Kun; Wei, Xiao; Du, Yuanxin; Gao, Shan; Kang, Xi; Zhu, Manzhou |
| Journal of publication | Nanoscale |
| Year of publication | 2023 |
| Journal volume | 15 |
| Journal issue | 36 |
| Pages of publication | 14941 - 14948 |
| a | 31.3153 ± 0.0002 Å |
| b | 21.44 ± 0.0002 Å |
| c | 37.3504 ± 0.0003 Å |
| α | 90° |
| β | 97.916 ± 0.001° |
| γ | 90° |
| Cell volume | 24838.1 ± 0.3 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0909 |
| Residual factor for significantly intense reflections | 0.0838 |
| Weighted residual factors for significantly intense reflections | 0.23 |
| Weighted residual factors for all reflections included in the refinement | 0.242 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54186 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1569762.html
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Users of the data should acknowledge the original authors of the
structural data.