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Information card for entry 1570547
Preview
Coordinates | 1570547.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H26 Cl Cu N3 O4 S2 |
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Calculated formula | C36 H26 Cl Cu N3 O4 S2 |
Title of publication | Mechanistic insights into radical formation and functionalization in copper/<i>N</i>-fluorobenzenesulfonimide radical-relay reactions. |
Authors of publication | Mandal, Mukunda; Buss, Joshua A.; Chen, Si-Jie; Cramer, Christopher J.; Stahl, Shannon S. |
Journal of publication | Chemical science |
Year of publication | 2024 |
Journal volume | 15 |
Journal issue | 4 |
Pages of publication | 1364 - 1373 |
a | 10.232 ± 0.003 Å |
b | 10.735 ± 0.004 Å |
c | 16.557 ± 0.008 Å |
α | 85.248 ± 0.014° |
β | 72.999 ± 0.017° |
γ | 74.424 ± 0.014° |
Cell volume | 1675.3 ± 1.1 Å3 |
Cell temperature | 99.99 K |
Ambient diffraction temperature | 99.99 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.06 |
Residual factor for significantly intense reflections | 0.0397 |
Weighted residual factors for significantly intense reflections | 0.0942 |
Weighted residual factors for all reflections included in the refinement | 0.1009 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1570547.html
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