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Information card for entry 1570609
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Coordinates | 1570609.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | ZSM-25 |
---|---|
Formula | Na156 O2880 Si1440 |
Calculated formula | Na156 O2880 Si1440 |
Title of publication | STEM SerialED: achieving high-resolution data for ab initio structure determination of beam-sensitive nanocrystalline materials. |
Authors of publication | Hogan-Lamarre, Pascal; Luo, Yi; Bücker, Robert; Miller, R. J. Dwayne; Zou, Xiaodong |
Journal of publication | IUCrJ |
Year of publication | 2024 |
Journal volume | 11 |
Journal issue | Pt 1 |
Pages of publication | 62 - 72 |
a | 43.269 ± 0.005 Å |
b | 43.269 ± 0.005 Å |
c | 43.269 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 81008 ± 16 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 217 |
Hermann-Mauguin space group symbol | I -4 3 m |
Hall space group symbol | I -4 2 3 |
Residual factor for all reflections | 0.3351 |
Residual factor for significantly intense reflections | 0.2684 |
Weighted residual factors for significantly intense reflections | 0.5468 |
Weighted residual factors for all reflections included in the refinement | 0.5815 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.566 |
Diffraction radiation probe | electron |
Diffraction radiation wavelength | 0.0196 Å |
Diffraction radiation type | electron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1570609.html
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