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Information card for entry 1570799
Preview
| Coordinates | 1570799.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (IMes)AgTBOS |
|---|---|
| Chemical name | (IMes)Ag(OSi(OtBu)3) |
| Formula | C33 H51 Ag N2 O4 Si |
| Calculated formula | C33 H51 Ag N2 O4 Si |
| SMILES | [Ag](O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)=C1N(C=CN1c1c(cc(cc1C)C)C)c1c(C)cc(cc1C)C |
| Title of publication | <sup>109</sup>Ag NMR chemical shift as a descriptor for Brønsted acidity from molecules to materials. |
| Authors of publication | Hansen, Colin; Docherty, Scott R.; Cao, Weicheng; Yakimov, Alexander V.; Copéret, Christophe |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 8 |
| Pages of publication | 3028 - 3032 |
| a | 11.1581 ± 0.0002 Å |
| b | 16.6129 ± 0.0002 Å |
| c | 19.1762 ± 0.0003 Å |
| α | 90° |
| β | 104.952 ± 0.002° |
| γ | 90° |
| Cell volume | 3434.31 ± 0.1 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0485 |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for significantly intense reflections | 0.0857 |
| Weighted residual factors for all reflections included in the refinement | 0.09 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.19 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1570799.html
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Users of the data should acknowledge the original authors of the
structural data.