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Information card for entry 1571338
Preview
| Coordinates | 1571338.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H56 O2 Si4 Sn |
|---|---|
| Calculated formula | C54 H56 O2 Si4 Sn |
| SMILES | [Sn](O)(O)(C([Si](C)(c1ccccc1)c1ccccc1)[Si](C)(c1ccccc1)c1ccccc1)C([Si](C)(c1ccccc1)c1ccccc1)[Si](C)(c1ccccc1)c1ccccc1 |
| Title of publication | A tin analogue of propadiene with cumulated C[double bond, length as m-dash]Sn double bonds. |
| Authors of publication | Sugamata, Koh; Asakawa, Teppei; Minoura, Mao |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 19 |
| Pages of publication | 7072 - 7078 |
| a | 11.2316 ± 0.0003 Å |
| b | 12.9893 ± 0.0004 Å |
| c | 17.563 ± 0.0005 Å |
| α | 70.964 ± 0.003° |
| β | 75.647 ± 0.003° |
| γ | 84.203 ± 0.003° |
| Cell volume | 2345.98 ± 0.13 Å3 |
| Cell temperature | 110 ± 2 K |
| Ambient diffraction temperature | 110 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0304 |
| Residual factor for significantly intense reflections | 0.0264 |
| Weighted residual factors for significantly intense reflections | 0.0597 |
| Weighted residual factors for all reflections included in the refinement | 0.0614 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1571338.html
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