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Information card for entry 1571461
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Coordinates | 1571461.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H24 O2 S2 |
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Calculated formula | C28 H24 O2 S2 |
Title of publication | Benchmarking break-junction techniques: electric and thermoelectric characterization of naphthalenophanes. |
Authors of publication | Hurtado-Gallego, Juan; van der Poel, Sebastiaan; Blaschke, Matthias; Gallego, Almudena; Hsu, Chunwei; López-Nebreda, Rubén; Mayor, Marcel; Pauly, Fabian; Agraït, Nicolás; van der Zant, Herre S. J. |
Journal of publication | Nanoscale |
Year of publication | 2024 |
Journal volume | 16 |
Journal issue | 22 |
Pages of publication | 10751 - 10759 |
a | 10.9064 ± 0.0005 Å |
b | 18.3923 ± 0.0011 Å |
c | 10.9552 ± 0.0005 Å |
α | 90° |
β | 90.901 ± 0.004° |
γ | 90° |
Cell volume | 2197.27 ± 0.19 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1056 |
Residual factor for significantly intense reflections | 0.0813 |
Weighted residual factors for significantly intense reflections | 0.2333 |
Weighted residual factors for all reflections included in the refinement | 0.2574 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.34143 Å |
Diffraction radiation type | GaKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1571461.html
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Users of the data should acknowledge the original authors of the
structural data.