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Information card for entry 1571548
Preview
| Coordinates | 1571548.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H44 N2 O4 S4 |
|---|---|
| Calculated formula | C26 H44 N2 O4 S4 |
| SMILES | S(SSSN1C(CC(OC(=O)C(=C)C)CC1(C)C)(C)C)N1C(CC(OC(=O)C(=C)C)CC1(C)C)(C)C |
| Title of publication | BiTEMPS methacrylate dynamic covalent cross-linker providing rapid reprocessability and extrudability of covalent adaptable networks: high-yield synthesis with strong selectivity for disulfide linkages |
| Authors of publication | Debsharma, Tapas; Purwanto, Nathan S.; Fenimore, Logan M.; Mitchell, Sarah; Kennedy, Jayme; Torkelson, John M. |
| Journal of publication | Polymer Chemistry |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 21 |
| Pages of publication | 2167 - 2176 |
| a | 13.9546 ± 0.0004 Å |
| b | 20.1055 ± 0.0006 Å |
| c | 11.0995 ± 0.0003 Å |
| α | 90° |
| β | 101.725 ± 0.003° |
| γ | 90° |
| Cell volume | 3049.14 ± 0.15 Å3 |
| Cell temperature | 99.99 ± 0.13 K |
| Ambient diffraction temperature | 99.99 ± 0.13 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.059 |
| Residual factor for significantly intense reflections | 0.0497 |
| Weighted residual factors for significantly intense reflections | 0.1327 |
| Weighted residual factors for all reflections included in the refinement | 0.1382 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.09 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1571548.html
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Users of the data should acknowledge the original authors of the
structural data.