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Information card for entry 1572381
Preview
| Coordinates | 1572381.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C204 H480 Ag66 O68 P34 Rh4 S68 |
|---|---|
| Calculated formula | C204 H480 Ag66 O68 P34 Rh4 S68 |
| Title of publication | Controlled aggregation of Pt/PtH/Rh/RhH doped silver superatomic nanoclusters into 16-electron supermolecules. |
| Authors of publication | Chiu, Tzu-Hao; Pillay, Michael N.; Wu, Ying-Yann; Niihori, Yoshiki; Negishi, Yuichi; Chen, Jie-Ying; Chen, Yuan Jang; Kahlal, Samia; Saillard, Jean-Yves; Liu, C. W. |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 36 |
| Pages of publication | 14660 - 14667 |
| a | 16.193 ± 0.002 Å |
| b | 34.224 ± 0.005 Å |
| c | 38.997 ± 0.005 Å |
| α | 72.855 ± 0.004° |
| β | 84.982 ± 0.003° |
| γ | 83.671 ± 0.002° |
| Cell volume | 20491 ± 5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1174 |
| Residual factor for significantly intense reflections | 0.0666 |
| Weighted residual factors for significantly intense reflections | 0.1254 |
| Weighted residual factors for all reflections included in the refinement | 0.1519 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.103 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1572381.html
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