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Information card for entry 1572827
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Coordinates | 1572827.cif |
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Original paper (by DOI) | HTML |
Chemical name | Hf6-phenylphosphinate |
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Formula | C73.45 H78.9 Cl2.9 Hf6 O32 P12 |
Calculated formula | C72.2 H76.4 Cl0.4 Hf6 O32 P12 |
Title of publication | Atomically precise surface chemistry of zirconium and hafnium metal oxo clusters beyond carboxylate ligands |
Authors of publication | Unniram Parambil, Ajmal Roshan; Pokratath, Rohan; Parammal, Muhammed Jibin; Dhaene, Evert; Van den Eynden, Dietger; Balog, Sandor; Prescimone, Alessandro; Infante, Ivan; Shahgaldian, Patrick; De Roo, Jonathan |
Journal of publication | Chemical Science |
Year of publication | 2024 |
a | 14.3934 ± 0.0003 Å |
b | 15.1871 ± 0.0003 Å |
c | 24.943 ± 0.0005 Å |
α | 89.932 ± 0.002° |
β | 99.74 ± 0.002° |
γ | 115.133 ± 0.002° |
Cell volume | 4849.75 ± 0.19 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0984 |
Residual factor for significantly intense reflections | 0.0899 |
Weighted residual factors for significantly intense reflections | 0.2276 |
Weighted residual factors for all reflections included in the refinement | 0.2348 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.34143 Å |
Diffraction radiation type | GaKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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