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Information card for entry 1573020
Preview
| Coordinates | 1573020.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H30 Cl4 N2 P2 Zn |
|---|---|
| Calculated formula | C34 H30 Cl4 N2 P2 Zn |
| SMILES | c1(cccc[nH+]1)P(c1ccccc1)c1ccccc1.Cl[Zn](Cl)([Cl-])[Cl-].c1(cccc[nH+]1)P(c1ccccc1)c1ccccc1 |
| Title of publication | Optical activity levels of metal centers controlling multi-mode emissions in low-dimensional hybrid metal halides for anti-counterfeiting and information encryption. |
| Authors of publication | Ren, Qiqiong; Zhou, Guojun; Mao, Yilin; Zhang, Nan; Zhang, Jian; Zhang, Xian-Ming |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 40 |
| Pages of publication | 16536 - 16545 |
| a | 16.3042 ± 0.0012 Å |
| b | 8.1166 ± 0.0006 Å |
| c | 26.7689 ± 0.0019 Å |
| α | 90° |
| β | 96.491 ± 0.002° |
| γ | 90° |
| Cell volume | 3519.7 ± 0.4 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0729 |
| Residual factor for significantly intense reflections | 0.0445 |
| Weighted residual factors for significantly intense reflections | 0.0987 |
| Weighted residual factors for all reflections included in the refinement | 0.1087 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1573020.html
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