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Information card for entry 1573229
Preview
| Coordinates | 1573229.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H16 As2 S4 |
|---|---|
| Calculated formula | C34 H16 As2 S4 |
| SMILES | [as]1c2c(c(c3c4sc5c(c4[as]c4c6c(sc34)cccc6)cccc5)c3sc4c(c13)cccc4)sc1c2cccc1 |
| Title of publication | Dithienoarsinines: stable and planar π-extended arsabenzenes. |
| Authors of publication | Sumida, Akifumi; Saeki, Akinori; Matsuo, Kyohei; Naka, Kensuke; Imoto, Hiroaki |
| Journal of publication | Chemical science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 3 |
| Pages of publication | 1126 - 1135 |
| a | 8.0954 ± 0.0006 Å |
| b | 11.366 ± 0.0007 Å |
| c | 15.4655 ± 0.0008 Å |
| α | 87.822 ± 0.005° |
| β | 85.309 ± 0.005° |
| γ | 80.114 ± 0.006° |
| Cell volume | 1396.77 ± 0.16 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0609 |
| Residual factor for significantly intense reflections | 0.0421 |
| Weighted residual factors for significantly intense reflections | 0.0969 |
| Weighted residual factors for all reflections included in the refinement | 0.1076 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1573229.html
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Users of the data should acknowledge the original authors of the
structural data.