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Information card for entry 1573359
Preview
| Coordinates | 1573359.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | H0 O10 Si2 Zn4 |
|---|---|
| Calculated formula | O10 Si2 Zn4 |
| Title of publication | Incommensurately modulated structure of Zn<sub>4</sub>Si<sub>2</sub>O<sub>7</sub>(OH)<sub>2</sub>·H<sub>2</sub>O at high pressure. |
| Authors of publication | Gajda, Roman; Sławiński, Wojciech; Poręba, Tomasz; Parafiniuk, Jan; Mezouar, Mohamed; Dera, Przemysław; Woźniak, Krzysztof |
| Journal of publication | IUCrJ |
| Year of publication | 2025 |
| Journal volume | 12 |
| Journal issue | 1 |
| a | 8.0977 ± 0.0006 Å |
| b | 10.5415 ± 0.001 Å |
| c | 5.0266 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 429.08 ± 0.05 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 34 |
| Hermann-Mauguin space group symbol | P n n 2 |
| Hall space group symbol | P 2 -2n |
| Residual factor for all reflections | 0.2921 |
| Residual factor for significantly intense reflections | 0.1875 |
| Weighted residual factors for significantly intense reflections | 0.2063 |
| Weighted residual factors for all reflections included in the refinement | 0.239 |
| Goodness-of-fit parameter for significantly intense reflections | 9.1391 |
| Goodness-of-fit parameter for all reflections included in the refinement | 7.7139 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.2229 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1573359.html
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Users of the data should acknowledge the original authors of the
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