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Information card for entry 1573363
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Coordinates | 1573363.cif |
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Original paper (by DOI) | HTML |
Formula | H4 O10 Si2 Zn4 |
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Calculated formula | O10 Si2 Zn4 |
Title of publication | Incommensurately modulated structure of Zn<sub>4</sub>Si<sub>2</sub>O<sub>7</sub>(OH)<sub>2</sub>·H<sub>2</sub>O at high pressure. |
Authors of publication | Gajda, Roman; Sławiński, Wojciech; Poręba, Tomasz; Parafiniuk, Jan; Mezouar, Mohamed; Dera, Przemysław; Woźniak, Krzysztof |
Journal of publication | IUCrJ |
Year of publication | 2025 |
Journal volume | 12 |
Journal issue | 1 |
a | 8.31709 ± 0.00017 Å |
b | 10.706 ± 0.003 Å |
c | 5.09489 ± 0.00007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 453.66 ± 0.13 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 44 |
Hermann-Mauguin space group symbol | I m m 2 |
Hall space group symbol | I 2 -2 |
Residual factor for all reflections | 0.0626 |
Residual factor for significantly intense reflections | 0.0562 |
Weighted residual factors for significantly intense reflections | 0.1595 |
Weighted residual factors for all reflections included in the refinement | 0.1687 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.2229 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1573363.html
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