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Information card for entry 1573529
Preview
| Coordinates | 1573529.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Al2 Ca H6 O13 Si3 |
|---|---|
| Calculated formula | Al2 Ca H6 O13 Si3 |
| Title of publication | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering. |
| Authors of publication | Tajiri, Hiroo; Kohara, Shinji; Kimura, Koji; Halubai, Sekhar; Morimoto, Haruto; Happo, Naohisa; Stellhorn, Jens R.; Onodera, Yohei; Qiao, Xvsheng; Urushihara, Daisuke; Hu, Peidong; Wakihara, Toru; Kinoshita, Toyohiko; Hayashi, Koichi |
| Journal of publication | Journal of synchrotron radiation |
| Year of publication | 2025 |
| Journal volume | 32 |
| Journal issue | 1 |
| Pages of publication | 125 - 132 |
| a | 6.5252 ± 0.0001 Å |
| b | 18.9769 ± 0.0003 Å |
| c | 9.7779 ± 0.0002 Å |
| α | 90° |
| β | 108.857 ± 0.0006° |
| γ | 90° |
| Cell volume | 1145.79 ± 0.03 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0266 |
| Residual factor for significantly intense reflections | 0.024 |
| Weighted residual factors for significantly intense reflections | 0.0619 |
| Weighted residual factors for all reflections included in the refinement | 0.073 |
| Goodness-of-fit parameter for significantly intense reflections | 1.95 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.26 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1573529.html
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Users of the data should acknowledge the original authors of the
structural data.