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Information card for entry 1573681
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| Coordinates | 1573681.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Triphenylsulfonium triiodide |
|---|---|
| Formula | C18 H15 I3 S |
| Calculated formula | C18 H15 I3 S |
| SMILES | I[I-]I.c1([S+](c2ccccc2)c2ccccc2)ccccc1 |
| Authors of publication | Artis, Rylan; Callaway, Waylan; Heyward, Elizabeth; Reyes, Naomi; Roberts, Gavin; Van Ostenbridge, Kaitlyn; Padgett, Clifford W.; Lynch, Will E. |
| Journal of publication | Acta Crystallographica, Section E: Crystallographic Communications |
| Year of publication | 2025 |
| Journal volume | 81 |
| Journal issue | 2 |
| Pages of publication | 114 - 119 |
| a | 12.8971 ± 0.0001 Å |
| b | 11.9414 ± 0.0001 Å |
| c | 13.0718 ± 0.0001 Å |
| α | 90° |
| β | 92.374 ± 0.001° |
| γ | 90° |
| Cell volume | 2011.45 ± 0.03 Å3 |
| Cell temperature | 298.7 ± 0.3 K |
| Ambient diffraction temperature | 299.15 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0374 |
| Residual factor for significantly intense reflections | 0.0306 |
| Weighted residual factors for significantly intense reflections | 0.0733 |
| Weighted residual factors for all reflections included in the refinement | 0.0771 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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