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Information card for entry 2003686
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Coordinates | 2003686.cif |
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Original IUCr paper | HTML |
Chemical name | chlorotris(dimethylphenylphosphine)nitrido(trifluoromethanesulfonato)rhenium(V) |
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Formula | C25 H33 Cl F3 N O3 P3 Re S |
Calculated formula | C25 H33 Cl F3 N O3 P3 Re S |
SMILES | [Re](Cl)([P](c1ccccc1)(C)C)([P](c1ccccc1)(C)C)([P](c1ccccc1)(C)C)(#N)OS(=O)(=O)C(F)(F)F |
Title of publication | <i>mer</i>,<i>cis</i>-Chlorotris(dimethylphenylphosphine)nitrido(trifluoromethylsulfonato)rhenium(V) |
Authors of publication | Abram, U.; Walker, I. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 7 |
Pages of publication | 1250 - 1251 |
a | 17.589 ± 0.003 Å |
b | 10.164 ± 0.001 Å |
c | 16.807 ± 0.004 Å |
α | 90° |
β | 84.16 ± 0.01° |
γ | 90° |
Cell volume | 2989.1 ± 0.9 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 9 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0829 |
Residual factor for significantly intense reflections | 0.0513 |
Weighted residual factors for all reflections | 0.1469 |
Weighted residual factors for significantly intense reflections | 0.1201 |
Goodness-of-fit parameter for all reflections | 1.097 |
Goodness-of-fit parameter for significantly intense reflections | 1.046 |
Diffraction radiation wavelength | 0.7093 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2003686.html
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