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Information card for entry 2003686
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| Coordinates | 2003686.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | chlorotris(dimethylphenylphosphine)nitrido(trifluoromethanesulfonato)rhenium(V) |
|---|---|
| Formula | C25 H33 Cl F3 N O3 P3 Re S |
| Calculated formula | C25 H33 Cl F3 N O3 P3 Re S |
| SMILES | [Re](Cl)([P](c1ccccc1)(C)C)([P](c1ccccc1)(C)C)([P](c1ccccc1)(C)C)(#N)OS(=O)(=O)C(F)(F)F |
| Title of publication | <i>mer</i>,<i>cis</i>-Chlorotris(dimethylphenylphosphine)nitrido(trifluoromethylsulfonato)rhenium(V) |
| Authors of publication | Abram, U.; Walker, I. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1995 |
| Journal volume | 51 |
| Journal issue | 7 |
| Pages of publication | 1250 - 1251 |
| a | 17.589 ± 0.003 Å |
| b | 10.164 ± 0.001 Å |
| c | 16.807 ± 0.004 Å |
| α | 90° |
| β | 84.16 ± 0.01° |
| γ | 90° |
| Cell volume | 2989.1 ± 0.9 Å3 |
| Cell temperature | 213 ± 2 K |
| Ambient diffraction temperature | 213 ± 2 K |
| Number of distinct elements | 9 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0829 |
| Residual factor for significantly intense reflections | 0.0513 |
| Weighted residual factors for all reflections | 0.1469 |
| Weighted residual factors for significantly intense reflections | 0.1201 |
| Goodness-of-fit parameter for all reflections | 1.097 |
| Goodness-of-fit parameter for significantly intense reflections | 1.046 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.