Information card for entry 2003704

Structure parameters

• Formula: C59 H51 O4 P4 Rh
• Calculated formula: C59 H51 O4 P4 Rh
• SMILES: [Rh]1([P](c2c(cccc2)C)(c2ccccc2C)c2c(cccc2)C)([O]=P(C(=P(O1)(c1ccccc1)c1ccccc1)P(=O)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)C#[O]
• Title of publication: Carbonyl-κ<i>C</i>-[tris(diphenylphosphinoyl)methanido-κ^2^<i>O</i>,<i>O</i>'][tris(<i>o</i>-tolyl)phosphine-κ<i>P</i>]rhodium(I), [Rh(C{P(O)Ph~2~}~3~)(CO){P(<i>o</i>-Tol)~3~}]
• Authors of publication: Smit, D. M. C.; Basson, S. S.; Roodt, A.; Steynberg, E. C.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 1995
• Journal volume: 51
• Journal issue: 7
• Pages of publication: 1278 - 1280
• a: 11.069 ± 0.002 Å
• b: 14.426 ± 0.003 Å
• c: 16.561 ± 0.004 Å
• α: 81.64 ± 0.02°
• β: 105.19 ± 0.02°
• γ: 94.05 ± 0.02°
• Cell volume: 2523.5 ± 1 ų
• Cell temperature: 293 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0359
• Residual factor for significantly intense reflections: 0.0359
• Weighted residual factors for all reflections: 0.0973
• Weighted residual factors for significantly intense reflections: 0.0973
• Goodness-of-fit parameter for all reflections: 1.044
• Goodness-of-fit parameter for significantly intense reflections: 1.044
• Diffraction radiation wavelength: 1.5418 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No