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Information card for entry 2003804
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Coordinates | 2003804.cif |
---|---|
Original IUCr paper | HTML |
Formula | C50 H58 Cu4 N18 S4 |
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Calculated formula | C50 H58 Cu4 N18 S4 |
SMILES | c1([n]2[Cu]34([NH](CCC[N]3=Cc3n4ccc3)Cc2ccc1)N=C=S)C[NH]1CCC[N]2=Cc3n(ccc3)[Cu]312N=C=[S][Cu]12([NH](Cc4cccc5C[NH]6CCC[N]7=Cc8n(ccc8)[Cu]67([n]45)N=C=S)CCC[N]1=Cc1n2ccc1)N=C=[S]3 |
Title of publication | Synthesis and Structure of a Tetracopper(II) Complex of a Pyrrole-Containing Unsymmetrical Binucleating Ligand: [Cu~2~<i>L</i>(NCS)~2~]~2~ |
Authors of publication | Brooker, S.; Carter, B. M. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 8 |
Pages of publication | 1522 - 1524 |
a | 10.527 ± 0.003 Å |
b | 12.163 ± 0.003 Å |
c | 12.653 ± 0.005 Å |
α | 107.36 ± 0.03° |
β | 104.31 ± 0.03° |
γ | 108.6 ± 0.02° |
Cell volume | 1356.5 ± 0.9 Å3 |
Cell temperature | 133 K |
Ambient diffraction temperature | 133 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0807 |
Residual factor for significantly intense reflections | 0.045 |
Weighted residual factors for all reflections | 0.0966 |
Weighted residual factors for significantly intense reflections | 0.0838 |
Goodness-of-fit parameter for all reflections | 1.052 |
Goodness-of-fit parameter for significantly intense reflections | 1.103 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2003804.html
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