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Information card for entry 2003892
Preview
Coordinates | 2003892.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | 1,1'-Bis(trimethylsilyl)ferrocene |
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Formula | C16 H26 Fe Si2 |
Calculated formula | C16 H26 Fe Si2 |
SMILES | [Fe]12345678([c]9([cH]2[cH]1[cH]5[cH]39)[Si](C)(C)C)[c]1([cH]4[cH]6[cH]7[cH]81)[Si](C)(C)C |
Title of publication | 1,1'-Bis(trimethylsilyl)ferrocenium Tetrachloroaluminate(1‒), 1,1'-Bis(trimethylsilyl)ferrocene and 1,1'-Dimethylferrocene |
Authors of publication | Foucher, D. A.; Honeyman, C. H.; Lough, A. J.; Manners, I.; Nelson, J. M. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 9 |
Pages of publication | 1795 - 1799 |
a | 6.173 ± 0.002 Å |
b | 8.103 ± 0.001 Å |
c | 16.915 ± 0.003 Å |
α | 90° |
β | 95.69 ± 0.02° |
γ | 90° |
Cell volume | 841.9 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0313 |
Residual factor for significantly intense reflections | 0.0279 |
Weighted residual factors for all reflections | 0.0819 |
Weighted residual factors for significantly intense reflections | 0.08 |
Goodness-of-fit parameter for all reflections | 1.054 |
Goodness-of-fit parameter for significantly intense reflections | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2003892.html
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