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Information card for entry 2003894
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Coordinates | 2003894.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | cis-Diethyldithiocarbamatodiiodophenyltellurium(IV) |
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Formula | C11 H15 I2 N S2 Te |
Calculated formula | C11 H15 I2 N S2 Te |
Title of publication | <i>cis</i>-(Diethyldithiocarbamato)diiodo(phenyl)tellurium(IV), PhTe(S~2~CNEt~2~)I~2~, and its Methoxy-Substituted Mixed Br/I Analogue <i>cis</i>-Bis(0.4-bromo/0.6-iodo)(diethyldithiocarbamato)(4-methoxyphenyl)tellurium(IV), <i>p</i>-MeOC~6~H~4~Te(S~2~CNEt~2~)(Br~0.4~I~0.6~)~2~ |
Authors of publication | Husebye, S.; Kudis, S.; Lindeman, S. V.; Strauch, P. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 9 |
Pages of publication | 1870 - 1875 |
a | 9.126 ± 0.001 Å |
b | 12.631 ± 0.001 Å |
c | 24.532 ± 0.004 Å |
α | 97.32 ± 0.01° |
β | 99.59 ± 0.01° |
γ | 105.46 ± 0.01° |
Cell volume | 2643.1 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0946 |
Residual factor for significantly intense reflections | 0.0465 |
Weighted residual factors for all reflections | 0.1411 |
Weighted residual factors for significantly intense reflections | 0.1138 |
Goodness-of-fit parameter for all reflections | 1.076 |
Goodness-of-fit parameter for significantly intense reflections | 1.221 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2003894.html
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Users of the data should acknowledge the original authors of the
structural data.