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Information card for entry 2004029
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Coordinates | 2004029.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Tris(diethyldithiocarbamato)-4-methoxyphenyltellurium(IV) |
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Formula | C22 H37 N3 O S6 Te |
Calculated formula | C22 H37 N3 O S6 Te |
SMILES | [Te]123(SC(=[S]1)N(CC)CC)([S]=C(S2)N(CC)CC)(SC(=[S]3)N(CC)CC)c1ccc(OC)cc1 |
Title of publication | Tris(diethyldithiocarbamato)(4-methoxyphenyl)tellurium(IV), <i>p</i>-MeOC~6~H~4~Te(S~2~CNEt~2~)~3~, and the Triclinic Modification of Tris(diethyldithiocarbamato)phenyltellurium(IV), PhTe(S~2~CNEt~2~)~3~ |
Authors of publication | Husebye, S.; Lindeman, S. V. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 10 |
Pages of publication | 2152 - 2157 |
a | 10.859 ± 0.002 Å |
b | 18.443 ± 0.003 Å |
c | 15.299 ± 0.005 Å |
α | 90° |
β | 92.66 ± 0.02° |
γ | 90° |
Cell volume | 3060.7 ± 1.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1063 |
Residual factor for significantly intense reflections | 0.0328 |
Weighted residual factors for all reflections | 0.1631 |
Weighted residual factors for significantly intense reflections | 0.0849 |
Goodness-of-fit parameter for all reflections | 1.093 |
Goodness-of-fit parameter for significantly intense reflections | 1.07 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2004029.html
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