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Information card for entry 2004045
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Coordinates | 2004045.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Dichloro(O,O'-diethyldithiophosphato-S,S')- bis(dimethylphenylphosphine)technetium(III) |
---|---|
Formula | C20 H32 Cl2 O2 P3 S2 Tc |
Calculated formula | C20 H32 Cl2 O2 P3 S2 Tc |
SMILES | [Tc]1(Cl)(Cl)([P](c2ccccc2)(C)C)([P](c2ccccc2)(C)C)[S]=P(S1)(OCC)OCC |
Title of publication | <i>trans</i>-Dichloro(<i>O</i>,<i>O</i>'-diethyldithiophosphato-<i>S</i>,<i>S</i>')bis(dimethylphenylphosphine)technetium(III) |
Authors of publication | Abram, U.; Abram, S.; Dilworth, J. R. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 10 |
Pages of publication | 1983 - 1985 |
a | 32.885 ± 0.003 Å |
b | 8.983 ± 0.002 Å |
c | 19.043 ± 0.002 Å |
α | 90° |
β | 101.49 ± 0.01° |
γ | 90° |
Cell volume | 5512.7 ± 1.5 Å3 |
Cell temperature | 208 ± 2 K |
Ambient diffraction temperature | 208 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0377 |
Residual factor for significantly intense reflections | 0.0271 |
Weighted residual factors for all reflections | 0.0753 |
Weighted residual factors for significantly intense reflections | 0.0689 |
Goodness-of-fit parameter for all reflections | 1.068 |
Goodness-of-fit parameter for significantly intense reflections | 1.074 |
Diffraction radiation wavelength | 0.7093 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2004045.html
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