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Information card for entry 2004145
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Coordinates | 2004145.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | 2,7-dimethyl-4-(phenylsulfonyl)-1,6-dioxaspiro[4.5]decan-10-one |
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Formula | C16 H20 O5 S |
Calculated formula | C16 H20 O5 S |
SMILES | S(=O)(=O)([C@H]1C[C@H](C)O[C@]21O[C@@H](C)CCC2=O)c1ccccc1.S(=O)(=O)([C@@H]1C[C@@H](C)O[C@@]21O[C@H](C)CCC2=O)c1ccccc1 |
Title of publication | 4-Sulfonyl-1,6-dioxaspiro[4.5]decanes |
Authors of publication | Alonso, I.; López-Solera, I.; Raithby, P. R. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1995 |
Journal volume | 51 |
Journal issue | 11 |
Pages of publication | 2381 - 2383 |
a | 8.613 ± 0.002 Å |
b | 10.453 ± 0.002 Å |
c | 10.561 ± 0.002 Å |
α | 63.55 ± 0.03° |
β | 68.81 ± 0.03° |
γ | 84.74 ± 0.03° |
Cell volume | 791 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.046 |
Residual factor for significantly intense reflections | 0.0427 |
Weighted residual factors for all reflections | 0.1232 |
Weighted residual factors for significantly intense reflections | 0.1199 |
Goodness-of-fit parameter for all reflections | 1.05 |
Goodness-of-fit parameter for significantly intense reflections | 1.077 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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